专利名称：Systems and methods for generating an
improved diffraction profile
发明人：Geoffrey Harding申请号：US11484533申请日：20060711公开号：US07773724B2公开日：20100810
专利附图：
摘要：A system for generating an improved diffraction profile is described. Thesystem includes at least one x-ray source configured to generate x-rays and a primarycollimator outputting a first x-ray beam to a first focus point and a second x-ray beam to
a second focus point. The primary collimator generates the first and second x-ray beamsfrom the x-rays. The system further includes a container, and a first scatter detectorconfigured to detect a first set of scattered radiation generated upon intersection of thefirst x-ray beam with the container and to detect a second set of scattered radiationgenerated upon intersection of the second x-ray beam with the container. An angle ofscatter of the first set of scattered radiation detected by the first scatter detector is atmost half of an angle of scatter of the second set of scattered radiation detected by thefirst scatter detector.
申请人：Geoffrey Harding
地址：Hamburg DE
国籍：DE
代理机构：Armstrong Teasdale LLP
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