EDDY CURRENT TESTING DEVICE

专利名称：EDDY CURRENT TESTING DEVICE发明人：Hisashi Endo,Akira Nishimizu,Hirofumi

Ouchi,Yoshio Nonaka

申请号：US12389499申请日：20090220

公开号：US20090230952A1公开日：20090917

专利附图：

摘要：An eddy current testing device which confirms that a change in characteristics ofa target object is detected regardless of the magnitude of the change and specifying theposition of a portion from which the change is detected. The device uses an eddy current

probe to inspect a bent portion of a metal body, and has an inspection controller and adisplay unit. The inspection controller calculates a phase angle of a signal detected bythe eddy current probe and generates flaw identification image data that indicates anarea (or an area of the signal detected and determined to correspond to a flaw signal,based on the phase angle of the detected signal) of a flaw signal in coordinates in whichthe position of the portion of the target object is plotted along a coordinate axis. Thedisplay unit displays the flaw identification image data.

申请人：Hisashi Endo,Akira Nishimizu,Hirofumi Ouchi,Yoshio Nonaka

地址：Hitachi JP,Tokai JP,Mito JP,Hitachi JP

国籍：JP,JP,JP,JP

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